JPH0330084B2 - - Google Patents

Info

Publication number
JPH0330084B2
JPH0330084B2 JP1760984A JP1760984A JPH0330084B2 JP H0330084 B2 JPH0330084 B2 JP H0330084B2 JP 1760984 A JP1760984 A JP 1760984A JP 1760984 A JP1760984 A JP 1760984A JP H0330084 B2 JPH0330084 B2 JP H0330084B2
Authority
JP
Japan
Prior art keywords
measuring force
arm
stylus
arm holder
coil spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1760984A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60161503A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1760984A priority Critical patent/JPS60161503A/ja
Publication of JPS60161503A publication Critical patent/JPS60161503A/ja
Publication of JPH0330084B2 publication Critical patent/JPH0330084B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
JP1760984A 1984-02-01 1984-02-01 表面粗さ測定機用検出装置 Granted JPS60161503A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1760984A JPS60161503A (ja) 1984-02-01 1984-02-01 表面粗さ測定機用検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1760984A JPS60161503A (ja) 1984-02-01 1984-02-01 表面粗さ測定機用検出装置

Publications (2)

Publication Number Publication Date
JPS60161503A JPS60161503A (ja) 1985-08-23
JPH0330084B2 true JPH0330084B2 (en]) 1991-04-26

Family

ID=11948623

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1760984A Granted JPS60161503A (ja) 1984-02-01 1984-02-01 表面粗さ測定機用検出装置

Country Status (1)

Country Link
JP (1) JPS60161503A (en])

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH082647B2 (ja) * 1988-08-17 1996-01-17 日立テクノエンジニアリング株式会社 スクリーンレスパターン描画装置
DE69208979T2 (de) * 1991-07-15 1996-07-25 Matsushita Electric Industrial Co., Ltd., Kadoma, Osaka Freitragender Ausleger für Atomkraftmikroskop und Verfahren zu dessen Herstellung
IT1299902B1 (it) * 1998-03-13 2000-04-04 Marposs Spa Testa, apparecchiatura e metodo per il controllo di dimensioni lineari di pezzi meccanici.
JP4681779B2 (ja) * 2001-09-25 2011-05-11 キヤノン株式会社 表面性識別装置、及び画像形成装置
KR101219691B1 (ko) 2006-05-03 2013-01-09 현대자동차주식회사 크랙 판별장치
JP6122312B2 (ja) * 2013-02-28 2017-04-26 株式会社ミツトヨ 形状測定機
JP6189153B2 (ja) * 2013-09-18 2017-08-30 株式会社ミツトヨ 梃子式測定器
CN109470136B (zh) * 2018-12-13 2020-11-13 浙江正同管业有限公司 一种用于冷轧带钢的平面度检测装置

Also Published As

Publication number Publication date
JPS60161503A (ja) 1985-08-23

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term